FEI Talos F200X TEM Find out more about the FEI Talos F200X TEM Keys Facts Location: Engineering East A010 Maximum accelerating voltage - 200 kV Total beam current - >50 nA STEM magnification range - ...

Industry-leading energy dispersive X-Ray spectroscopy (EDS) signal detection is combined with exceptional high-resolution STEM and TEM imaging in the Thermo Scientific Talos F200X STEM scanning ...

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope offers several key capabilities; conventional TEM mode (CTEM), Scanning TEM mode (STEM), Energy Filter TEM (EFTEM), Electron Energy ...

Caption (a, b) SEM images of a Q. cambria on the macrofossil in Fig. 2a, indicating FIB milling positions of longitudinal and cross sections, respectively. (c) STEM-HAADF image of the ultrathin ...

In this paper, we explore how to make accurate EDS reconstructions from such data. We propose to augment EDS tomography by joining with it a more accurate high-angle annular dark-field STEM ...

An auto-tuning method for high-angle annular detector dark field scanning transmission electron microscopy (HAADF-STEM is proposed which corrects the defocus to the optimum Scherzer focus and ...