Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

Zeta™ optical profilers with integrated diamond scribe enable precise sample marking for advanced analysis and defect ...

Following the detection of the outlier die, the software pinpoints the location in the chip where the problem occurred. Fig. 2: Reducing DPPM while simplifying defect investigation: proteanTecs ...