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Fatigue Crack Networks in Die-Attach Layers of IGBT Modules Under a Power Cycling Test - IEEE Xplore
The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network (FCN) has ...
>>> print yahoo. get_historical ('2014-04-25', '2014-04-29') [{u'Volume': u'28720000', u'Symbol': u'YHOO', u'Adj_Close': u'35.83', u'High': u'35.89', u'Low': u'34.12 ...
Inductive pulsed power supply (IPPS) is a competitive type of power supply for electromagnetic launch (EML). Compared with the capacitive type, the structure and working process of IPPS are more ...
The package can be installed via opam: opam install ocaml-in-python installs the latest release, opam pin add -k path . && opam install ocaml-in-python executed in a clone of this repository installs ...
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