A groundbreaking study has mapped the full neural circuit that carries cool temperature signals from the skin to the brain.

To address the persistent challenge of thermal stress, the leading cause of SiC MOSFET failure, it is essential to enhance their field robustness and extend their lifespan through precise junction ...

This article presents the design, implementation, and experimental evaluation of a novel measurement circuit for four-wire resistive sensors, such as resistance temperature detector (RTD) thermal ...