AFCIs include a test circuit to ensure that the arc fault detection circuit is functioning properly. The test button generates a signal similar to an arcing output waveform of the load current sensor.

The Built-In Self-Test (BIST) implementation for fault detection in VLSI circuits focuses on integrating self-testing mechanisms within the circuit design. This approach helps detect faults, enhance ...

Building an interpretable fault detection and diagnostic model based on few-shot circuit samples and prior information about circuit structures is of significant importance. To fill these gaps, we ...