Zeta™ optical profilers with integrated diamond scribe enable precise sample marking for advanced analysis and defect ...

Following the detection of the outlier die, the software pinpoints the location in the chip where the problem occurred. Fig. 2: Reducing DPPM while simplifying defect investigation: proteanTecs ...

For socket pin-defect inspection, object detection is the preferred approach. For object classification, limited interpretability (that is, distinguishing the class of “good pins” from the class of ...