The proposed methodology utilizes the convolutional neural network (CNN) architecture U-Net for image segmentation and then applies the CNN architecture InceptionV3-Net for fault classification.

The software supports CNN, DNN and KNN algorithms. The use of CNN and DNN are currently mainstream in the development of deep learning (DL) for ADC classification in the semiconductor industry. We ...

Machines are rapidly gaining the ability to perceive, interpret and interact with the visual world in ways that were once ...