Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples. Get analytical ...

Widefield, laser scanning and focussed ion beam scanning electron microscopy are all combined in the ZEISS Correlative Cryo Workflow in a single, simple operation. From fluorescent macromolecule ...

ZEISS EVO series combines high definition Scanning Electron Microscopy with high throughput automated workflow. Experience excellence in extended pressure mode imaging, thanks to the latest ...

ZEISS Medical Technology continued to push the boundaries of surgical precision and workflow efficiency with the introduction ...

The microscope's charge compensation system allows non-conducting samples to be imaged without the need for coating. Secondary electron images of butterfly scales from Artogeia napi. Acquired using ...

The microscope's charge compensation system allows non-conducting samples to be imaged without the need for coating. Secondary electron images of butterfly scales from Artogeia napi. Acquired using ...

ZEISS Atlas 5 is a powerful hardware and software package that extends the capacity of ZEISS scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM). ZEISS Atlas 5 streamlines ...

The X-ray microscope (XRM) uses optical magnification to enhance the resolution of micro CT. Like electron microscopy, micro CT has applications in all fields of science, engineering and industrial ...

A LEO (Zeiss) 435 Variable Pressure scanning electron microscope with an Oxford x-ray microanalysis system is also in the facility. The instrument can capture both digital (Zip disks required) or film ...

(Image: Carl Zeiss Microscopy) This instrument laid the groundwork for the modern Scanning Electron Microscope, marking a significant milestone in the field of microscopy. SEM's ability to produce ...